Circuit designed for measurement of dc current-versus-voltage characteristics of semiconductor devices. Operates in conjunction with x-y pen plotter or digital storage oscilloscope, which records data. Includes large feedback resistors to prevent high currents damaging device under test. Principal virtues: low cost, simplicity, and compactness. Also used to evaluate diodes and transistors.


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    Title :

    Circuit For Current-vs.-Voltage Tests Of Semiconductors


    Contributors:

    Published in:

    Publication date :

    1991-04-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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