Circuit designed for measurement of dc current-versus-voltage characteristics of semiconductor devices. Operates in conjunction with x-y pen plotter or digital storage oscilloscope, which records data. Includes large feedback resistors to prevent high currents damaging device under test. Principal virtues: low cost, simplicity, and compactness. Also used to evaluate diodes and transistors.
Circuit For Current-vs.-Voltage Tests Of Semiconductors
NASA Tech Briefs ; 15 , 4
01.04.1991
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Englisch