Ballistic-electron-emission microscope (BEEM) employs scanning tunneling-microscopy (STM) methods for nondestructive, direct electrical investigation of buried interfaces, such as interface between semiconductor and thin metal film. In BEEM, there are at least three electrodes: emitting tip, biasing electrode, and collecting electrode, receiving current crossing interface under investigation. Signal-processing device amplifies electrode signals and converts them into form usable by computer. Produces spatial images of surface by scanning tip; in addition, provides high-resolution images of buried interface under investigation. Spectroscopic information extracted by measuring collecting-electrode current as function of one of interelectrode voltages.
Ballistic-Electron-Emission Microscope
NASA Tech Briefs ; 14 , 1
1990-01-01
Miscellaneous
No indication
English
Ballistic Electron Emission Microscopy
NTRS | 1993
|Engineering Index Backfile | 1941
|Electrons go ballistic in field-emission display
British Library Online Contents | 2000