Ballistic-electron-emission microscope (BEEM) employs scanning tunneling-microscopy (STM) methods for nondestructive, direct electrical investigation of buried interfaces, such as interface between semiconductor and thin metal film. In BEEM, there are at least three electrodes: emitting tip, biasing electrode, and collecting electrode, receiving current crossing interface under investigation. Signal-processing device amplifies electrode signals and converts them into form usable by computer. Produces spatial images of surface by scanning tip; in addition, provides high-resolution images of buried interface under investigation. Spectroscopic information extracted by measuring collecting-electrode current as function of one of interelectrode voltages.


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    Titel :

    Ballistic-Electron-Emission Microscope


    Beteiligte:

    Erschienen in:

    Erscheinungsdatum :

    01.01.1990



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :





    Electron microscope

    Hegbar, H.R. | Engineering Index Backfile | 1941


    Electrons go ballistic in field-emission display

    British Library Online Contents | 2000