Report describes design, characteristics, and performance of Si:Sb integrated array of infrared detectors, sensitivity of which extends to wavelength of about 31 micrometer, improvement over 28-micrometer limit of current Si:As impurity-band-conduction devices. Also describes electronics and special Dewar system developed to test device at low temperature to reduce background noise.
Performance Of Infrared-Detector Array
NASA Tech Briefs ; 12 , 2
1988-02-01
Miscellaneous
No indication
English
Integrated detector array preprocessing for infrared astronomical applications
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