Compact test set integrated in computer-aided design system. Test set performs functional tests on very-large-scale integrated (VLSI) circuits. Makes tests from points within VLSI chip as well as at input and output pins. Used for quality control and design; in latter capacity, checks internal logic functions on chip and feed results directly to computer-aided design system for correction. Also simulates operation of chip design before chip is made. VLSI Tester contains three power supplies, control logic, and standard multibus circuit board in aluminum chassis. Chassis fits under platform of microprobe station. Multibus board links tester to interactive terminals and to host computer.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    VLSI-Chip Tester


    Contributors:

    Published in:

    Publication date :

    1987-04-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




    Single-Chip VLSI Reed-Solomon Encoder

    Truong, T. K. / Deutsch, L. J. / Reed, I. S. | NTRS | 1986


    Single-Chip VLSI Reed-Solomon Decoder

    Shao, Howard M. / Truong, Trieu-Kie / Hsu, In-Shek et al. | NTRS | 1988


    Dynamic friction tester ( DF Tester )

    Ichibara,K. / Abe,H. / Sangyo,N. et al. | Automotive engineering | 1992


    ICX:A custom VLSI-chip for engine control

    Geering,H.P. / ETH Zuerich,CH | Automotive engineering | 1989


    ICX: A custom VLSI-chip for engine control

    Geering, H.P. | Tema Archive | 1989