Algorithm specifies sequence of input test signals and interpretation of resulting output signals for identifying stuck-open faults in complementary metal-oxide semiconductor (CMOS) integrated logic circuits. Incorporated in software for online production testing of CMOS circuits.
Finding Open Faults In CMOS Circuits
NASA Tech Briefs ; 8 , 2
1984-11-01
Miscellaneous
No indication
English
Online Contents | 2010
Department highlights - Finding faults
Online Contents | 2005
Bridging Faults in BiCMOS Circuits
British Library Conference Proceedings | 1993
|Finding faults and engineering for earthquake survival
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|Latchup in CMOS Integrated Circuits
NTRS | 1985
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