Algorithm specifies sequence of input test signals and interpretation of resulting output signals for identifying stuck-open faults in complementary metal-oxide semiconductor (CMOS) integrated logic circuits. Incorporated in software for online production testing of CMOS circuits.


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    Title :

    Finding Open Faults In CMOS Circuits


    Contributors:

    Published in:

    Publication date :

    1984-11-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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