Electron beam probe technique estimate electron/hole capture cross sections in semiconductors with wide band gaps. Amplitude-modulated electron beam induces short-circuit current collected by ohmic contacts. Phase shift between this current and electron-beam current measured as function of frequency. Results of measurements used to ascertain recombination rates and energy levels.


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    Title :

    Electron Beam Could Probe Recombination Centers


    Contributors:
    Vonroos, O. (author)

    Published in:

    Publication date :

    1983-10-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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