Report evaluates effects of power and temperature overstress on Teledyne and Texas Instruments devices. Temperature stress caused most failures for both manufacturers' lots. Failure modes are analyzed.


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    Title :

    JANTX2N4856 field-effect transistor


    Published in:

    Publication date :

    1980-08-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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