Computer controlled device can check typical medium scale unit in less than one minute. System scans integrated circuit chip with narrow beam of light while simultaneously scanning reference chip.


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    Title :

    Optical integrated-circuit tester


    Contributors:

    Published in:

    Publication date :

    1977-06-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English


    Keywords :


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