Computer controlled device can check typical medium scale unit in less than one minute. System scans integrated circuit chip with narrow beam of light while simultaneously scanning reference chip.
Optical integrated-circuit tester
NASA Tech Briefs ; 2 , 1
1977-06-01
Miscellaneous
No indication
English
Programmable Low-Voltage Circuit Breaker and Tester
Online Contents | 2008
Programmable Low-Voltage Circuit Breaker and Tester
NTRS | 2008
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