Employing scanning transmission electron microscope as interferometer, relative phases of diffraction maximums can be determined by analysis of dark field images. Synthetic aperture technique and Fourier-transform computer processing of amplitude and phase information provide high resolution images at approximately one angstrom.
High-resolution electron microscope
NASA Tech Briefs ; 1 , 4
1977-03-01
Miscellaneous
No indication
English
Engineering Index Backfile | 1941
|Electrostatic electron microscope
TIBKAT | 1946
|Scanning microscope beats optical resolution
British Library Online Contents | 1998
Microscope yields 20-nm resolution
British Library Online Contents | 1999
Environmental scanning electron microscope
Online Contents | 1995