Employing scanning transmission electron microscope as interferometer, relative phases of diffraction maximums can be determined by analysis of dark field images. Synthetic aperture technique and Fourier-transform computer processing of amplitude and phase information provide high resolution images at approximately one angstrom.


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    Titel :

    High-resolution electron microscope


    Beteiligte:
    Nathan, R. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.03.1977



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


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