The primary objectives of this study were to: (1) assess factors affecting the reliability of three types of Programmable Read-Only Memories (PROMs), namely Polysilicon Fuse, Avalanche-Induced-Migration (AIM) and Nichrome Fuse Technologies, (2) Investigate fusing and associated failure mechanisms and (3) Assess the reliability of these PROM's via a life test.


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    Title :

    Reliability Evaluation of Programmable Read-only Memories (PROMs) Part II


    Contributors:
    K. L. Wong (author) / W. W. Powell (author) / R. L. Long (author) / T. M. Donnelly (author) / P. C. McMahan (author)

    Publication date :

    1977


    Size :

    152 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




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