The primary objectives of this study were to: (1) assess factors affecting the reliability of three types of Programmable Read-Only Memories (PROMs), namely Polysilicon Fuse, Avalanche-Induced-Migration (AIM) and Nichrome Fuse Technologies, (2) Investigate fusing and associated failure mechanisms and (3) Assess the reliability of these PROM's via a life test.
Reliability Evaluation of Programmable Read-only Memories (PROMs) Part II
1977
152 pages
Report
Keine Angabe
Englisch
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