A Comparison of Burn-in and Bake as Semiconductor Screening Techniques for the Nimbus Spacecraft Program
1965
49 pages
Report
No indication
English
Nimbus satellite , Screening technique , Semiconductor device , Baking , Burn , Device , Diode , Germanium , High temperature , Screening , Semiconductor , Silicon , Spacecraft , Storage , Technique , Transistor
Engineering Index Backfile | 1963
|NTRS | 1963
|NTRS | 1963
|NTRS | 1964
|NTRS | 1962
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