We present destructive single-event effects characterization of a variety of silicon Schottky diodes from different manufacturers. We also discuss suitable derating guidelines.


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    Title :

    Single-Event Threats for Diodes - It's Not Just Schottky Diodes


    Contributors:
    M. C. Casey (author) / J. Lauenstein (author) / E. P. Wilcox (author) / A. M. Phan (author) / K. A. LaBel (author)

    Publication date :

    2017


    Size :

    11 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




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