With the recent advancements in microcontroller technology, radar test equipment can be designed to improve the accuracy of measurements being made and simplify designs. An embedded integrator monitor design application (hardware and software) is presented and comparisons are made between the embedded design and the more traditional discrete design approach. 23 figs.
Using embedded microcontrollers in radar test equipment
1990
32 pages
Report
No indication
English
Radiofrequency Detection , Electrotechnology , Laboratory & Test Facility Design & Operation , Measuring Instruments , Radar , Microprocessors , Accuracy , Benchmarks , Computer Architecture , Data Processing , Design , Flexibility , Performance , Real Time Systems , Reliability , Standardization , Statistics , Testing , Meetings , Control equipment , EDB/440800 , EDB/426000 , EDB/990200
Reliability prediction for microcontrollers with embedded EEPROM
British Library Conference Proceedings | 2002
|Springer Verlag | 2024
|NTRS | 2016
|Online Contents | 1995