With the recent advancements in microcontroller technology, radar test equipment can be designed to improve the accuracy of measurements being made and simplify designs. An embedded integrator monitor design application (hardware and software) is presented and comparisons are made between the embedded design and the more traditional discrete design approach. 23 figs.


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    Titel :

    Using embedded microcontrollers in radar test equipment


    Beteiligte:
    R. S. Binney (Autor:in) / L. E. Riblett (Autor:in)

    Erscheinungsdatum :

    1990


    Format / Umfang :

    32 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch




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