Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Utilizing Focused Ion Beam (FIB) and Transmission Electron Microscopy (TEM) for Failure Analysis of Char Deposits Obtained from Space Shuttle Columbia Window Debris


    Contributors:
    M. C. Wright (author) / S. McDaniels (author) / R. Christoffersen (author) / Z. Rahman (author)

    Publication date :

    2011


    Size :

    23 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English