Dielectric loss measurements were performed on high purity semi-insulating SiC wafers of various grades. Analysis of experimental data would provide insight into the nature of loss mechanisms in this material and into its potential as an alternate material for gyrotron window applications. Experimental results will be presented.


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    Title :

    Dielectric Losses in SiC at Millimeter Wavelengths


    Contributors:
    Dutta, J. M. (author) / Yu, Guofen (author) / Jones, C. R. (author)


    Publication date :

    2006-09-01


    Size :

    1214092 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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