Dielectric loss measurements were performed on high purity semi-insulating SiC wafers of various grades. Analysis of experimental data would provide insight into the nature of loss mechanisms in this material and into its potential as an alternate material for gyrotron window applications. Experimental results will be presented.
Dielectric Losses in SiC at Millimeter Wavelengths
01.09.2006
1214092 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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