Technology status and qualification test results are discussed on two new deep submicron radiation hardened devices including a 64Mb SRAM family and stacked MCM versions of the C-RAM non-volatile memory. Electrical characterization and radiation test results will be discussed.
Advanced memory technologies for space and missile systems applications
2012-03-01
759798 byte
Conference paper
Electronic Resource
English
Dual-Use of Missile and Space Technologies
British Library Conference Proceedings | 1993
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