Technology status and qualification test results are discussed on two new deep submicron radiation hardened devices including a 64Mb SRAM family and stacked MCM versions of the C-RAM non-volatile memory. Electrical characterization and radiation test results will be discussed.


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    Title :

    Advanced memory technologies for space and missile systems applications


    Contributors:


    Publication date :

    2012-03-01


    Size :

    759798 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English