We describe a metrology subsystem for NASA's StarLight mission, a space-based separated-spacecraft stellar interferometer. It consists of dual-target linear metrology, based on a heterodyne interferometer with carrier phase modulation, and angular metrology designed to sense the pointing of the laser beam. The dual-target operation enables one metrology beam to sense displacement of two targets independently. We present the current design, breadboard implementation of the metrology subsystem in a stellar interferometer testbed and the present state of development of flight qualifiable subsystem components.


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    Title :

    The StarLight metrology subsystem


    Contributors:
    Dubovitsky, S. (author) / Lay, O.P. (author) / Abramovici, A. (author) / Hawley, J.G. (author) / Kuhnert, A.C. (author) / Mulder, J.L. (author) / Asbury, C.G. (author)


    Publication date :

    2002-01-01


    Size :

    967250 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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