We describe a metrology subsystem for NASA's StarLight mission, a space-based separated-spacecraft stellar interferometer. It consists of dual-target linear metrology, based on a heterodyne interferometer with carrier phase modulation, and angular metrology designed to sense the pointing of the laser beam. The dual-target operation enables one metrology beam to sense displacement of two targets independently. We present the current design, breadboard implementation of the metrology subsystem in a stellar interferometer testbed and the present state of development of flight qualifiable subsystem components.


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    Titel :

    The StarLight metrology subsystem


    Beteiligte:
    Dubovitsky, S. (Autor:in) / Lay, O.P. (Autor:in) / Abramovici, A. (Autor:in) / Hawley, J.G. (Autor:in) / Kuhnert, A.C. (Autor:in) / Mulder, J.L. (Autor:in) / Asbury, C.G. (Autor:in)


    Erscheinungsdatum :

    2002-01-01


    Format / Umfang :

    967250 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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