We develop an efficient algorithm to track point features supported by image patches undergoing affine deformations and changes in illumination. The algorithm is based on a combined model of geometry and photometry, that is used to track features as well as to detect outliers in a hypothesis testing framework. The algorithm runs in real time on a personal computer; and is available to the public.


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    Title :

    Real-time feature tracking and outlier rejection with changes in illumination


    Contributors:
    Hailin Jin, (author) / Favaro, P. (author) / Soatto, S. (author)


    Publication date :

    2001-01-01


    Size :

    855005 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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