We develop an efficient algorithm to track point features supported by image patches undergoing affine deformations and changes in illumination. The algorithm is based on a combined model of geometry and photometry, that is used to track features as well as to detect outliers in a hypothesis testing framework. The algorithm runs in real time on a personal computer; and is available to the public.


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    Titel :

    Real-time feature tracking and outlier rejection with changes in illumination


    Beteiligte:
    Hailin Jin, (Autor:in) / Favaro, P. (Autor:in) / Soatto, S. (Autor:in)


    Erscheinungsdatum :

    01.01.2001


    Format / Umfang :

    855005 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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