The reliability of oxide confined 850 nm VCSELs for 10 Gb/s operation was investigated. The median life with criteria of 2 dB decrease of output power at environmental temperature of 25/spl deg/C was over 10 million hours.


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    Title :

    Reliability of oxide confined 850 nm VCSELs for high speed interconnection systems


    Contributors:
    Sato, T. (author) / Iwai, N. (author) / Haga, Y. (author) / Ariga, M. (author) / Hama, T. (author) / Shimizu, H. (author) / Kasukawa, A. (author)


    Publication date :

    2003-01-01


    Size :

    75501 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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