In this work, we combine ultra-high resolution optical coherence tomography (OCT) with the concepts of en-face scanning. We apply the OCT technique for material analysis, where ultra-high resolution is required for imaging of structures with typical sizes of only a few microns like, e.g., the diameter of embedded fibres or the size of inclusions. We demonstrate the benefits of en-face scanning for a selected application where in-plane information is of interest which can hardly be obtained by cross-sectional OCT.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Ultra-high resolution en-face scanning optical coherence tomography for material investigation


    Contributors:
    Wiesauer, K. (author) / Stifter, D. (author)


    Publication date :

    2005-01-01


    Size :

    835706 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Alternate scanning modalities for high resolution optical coherence tomography

    Aguirre, A.D. / Hsiung, P. / Ko, T.H. et al. | IEEE | 2003


    Ultra-high-resolution optical coherence tomography gets adaptive-optic `glasses'

    Zawadzki, R.J. / Cense, B. / Jones, S.M. et al. | British Library Online Contents | 2008



    High-resolution optical coherence tomography and its dispersion compensation

    Chih-Wei Lu, / Meng-Tsan Tsai, / Yih-Ming Wang, et al. | IEEE | 2003


    High-resolution optical coherence tomography and its dispersion compensation

    Lu, C.-W. / Tsai, M.-T. / Wang, Y.-M. et al. | British Library Conference Proceedings | 2003