In this work, we combine ultra-high resolution optical coherence tomography (OCT) with the concepts of en-face scanning. We apply the OCT technique for material analysis, where ultra-high resolution is required for imaging of structures with typical sizes of only a few microns like, e.g., the diameter of embedded fibres or the size of inclusions. We demonstrate the benefits of en-face scanning for a selected application where in-plane information is of interest which can hardly be obtained by cross-sectional OCT.
Ultra-high resolution en-face scanning optical coherence tomography for material investigation
01.01.2005
835706 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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