In this paper we have studied and compared the optical intrinsic properties (refractive index, amplitude of the optical transition) of three different phase change optical recording materials, using diverse characterisation techniques such as spectrophotometric ellipsometry. From this result, we have simulated the performances of ternary semiconductor alloys in a classical case of multilayer stack and reported optical properties of those systems.


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    Title :

    Optical properties of phase change materials for optical recording


    Contributors:
    Bruneau, J.M. (author) / Bechevet, B. (author) / Valon, B. (author) / Butaud, E. (author)


    Publication date :

    1997-01-01


    Size :

    224406 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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