In this paper we have studied and compared the optical intrinsic properties (refractive index, amplitude of the optical transition) of three different phase change optical recording materials, using diverse characterisation techniques such as spectrophotometric ellipsometry. From this result, we have simulated the performances of ternary semiconductor alloys in a classical case of multilayer stack and reported optical properties of those systems.


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    Titel :

    Optical properties of phase change materials for optical recording


    Beteiligte:
    Bruneau, J.M. (Autor:in) / Bechevet, B. (Autor:in) / Valon, B. (Autor:in) / Butaud, E. (Autor:in)


    Erscheinungsdatum :

    01.01.1997


    Format / Umfang :

    224406 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    Optical Properties of Phase Change Materials for Optical Recording

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