The reliability testing methodology of 1550 nm, sub-200 nm broadly tunable InP-based laser chips for external cavity lasers is discussed. The article summarizes FIT rate achieved and degradation observed with multiple manufactured lots.


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    Title :

    Reliability testing methodology of broadly tunable laser chips for external cavity lasers


    Contributors:
    Konoplev, O. (author) / Heim, P.J.S. (author) / Merritt, S. (author) / Bowler, D. (author) / Hu, Y. (author) / Saini, S. (author) / Wilson, S. (author) / Leavitt, R. (author) / Stone, D. (author) / Dagenais, M. (author)


    Publication date :

    2003-01-01


    Size :

    149203 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English







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