The reliability testing methodology of 1550 nm, sub-200 nm broadly tunable InP-based laser chips for external cavity lasers is discussed. The article summarizes FIT rate achieved and degradation observed with multiple manufactured lots.
Reliability testing methodology of broadly tunable laser chips for external cavity lasers
2003-01-01
149203 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Reliability Testing Methodology of Broadly Tunable Laser Chips for External Cavity Lasers
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