A new approach is proposed to retrieve the wavefunction at the exit face of an object by capturing images at a series of closely spaced focus values and to process the whole 3D data. This technique is optimised for high resolution transmission electron microscopy and applied to experimentally obtained defocus series.<>


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    Title :

    Object wavefunction reconstruction in high resolution electron microscopy


    Contributors:
    Van Dyck, D. (author) / Op de Beeck, M. (author) / Coene, W. (author)


    Publication date :

    1994-01-01


    Size :

    284003 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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