A new approach is proposed to retrieve the wavefunction at the exit face of an object by capturing images at a series of closely spaced focus values and to process the whole 3D data. This technique is optimised for high resolution transmission electron microscopy and applied to experimentally obtained defocus series.<>
Object wavefunction reconstruction in high resolution electron microscopy
Proceedings of 1st International Conference on Image Processing ; 3 ; 295-298 vol.3
01.01.1994
284003 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Object Wavefunction Reconstruction in High Resolution Electron Microscopy
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