We show that near-field optical microscopy (NFOM) can be a powerful tool for the diagnosis and characterization of semiconductor laser structures, since it can obtain optical spectra with a spatial resolution better than 100nm. The capabilities of NFOM are demonstrated by characterizing a VCSEL in which spatial nonuniformities in the material cause a multi-mode emission pattern.


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    Title :

    Near field microscopy of vertical cavity lasers


    Contributors:
    Kash, J.A. (author) / Pezeshki, B. (author) / Agahi, F. (author) / Kisker, D.W. (author)


    Publication date :

    1995-01-01


    Size :

    479899 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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