We show that near-field optical microscopy (NFOM) can be a powerful tool for the diagnosis and characterization of semiconductor laser structures, since it can obtain optical spectra with a spatial resolution better than 100nm. The capabilities of NFOM are demonstrated by characterizing a VCSEL in which spatial nonuniformities in the material cause a multi-mode emission pattern.


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    Titel :

    Near field microscopy of vertical cavity lasers


    Beteiligte:
    Kash, J.A. (Autor:in) / Pezeshki, B. (Autor:in) / Agahi, F. (Autor:in) / Kisker, D.W. (Autor:in)


    Erscheinungsdatum :

    01.01.1995


    Format / Umfang :

    479899 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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