We developed a large phase shift-thick sample Z-scan theory, which is applicable to a range of sample thickness from thin sample limit to the thick sample regime and all the range of nonlinear phase shifts.


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    Title :

    Large phase shift Z-scan analysis for thick Kerr medium


    Contributors:
    Kwak, C.H. (author) / Lee, S.J. (author) / Lee, Y.L. (author)


    Publication date :

    2003-01-01


    Size :

    55978 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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