We developed a large phase shift-thick sample Z-scan theory, which is applicable to a range of sample thickness from thin sample limit to the thick sample regime and all the range of nonlinear phase shifts.
Large phase shift Z-scan analysis for thick Kerr medium
01.01.2003
55978 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Large phase shift z-scan analysis for thick Kerr medium
British Library Conference Proceedings | 2003
|Goos–Hänchen Shift from Cold and Hot Atomic Media Using Kerr Nonlinearity
British Library Online Contents | 2017
|British Library Conference Proceedings | 2005
|