An applied intelligence program for ATE fault diagnosis shows promise as an effective method to reduce mean time to repair (MTTR). The types of knowledge required by an intelligent diagnostic for VLSI test systems, the resources needed to derive that knowledge, the approach implemented to organize it, and the final form of the knowledge representations which resulted from our work are discussed in this paper.


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    Title :

    Knowledge Acquisition for ATE Diagnosis


    Contributors:


    Publication date :

    1986-07-01


    Size :

    1517748 byte




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English




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