An applied intelligence program for ATE fault diagnosis shows promise as an effective method to reduce mean time to repair (MTTR). The types of knowledge required by an intelligent diagnostic for VLSI test systems, the resources needed to derive that knowledge, the approach implemented to organize it, and the final form of the knowledge representations which resulted from our work are discussed in this paper.


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    Titel :

    Knowledge Acquisition for ATE Diagnosis


    Beteiligte:


    Erscheinungsdatum :

    01.07.1986


    Format / Umfang :

    1517748 byte




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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