An applied intelligence program for ATE fault diagnosis shows promise as an effective method to reduce mean time to repair (MTTR). The types of knowledge required by an intelligent diagnostic for VLSI test systems, the resources needed to derive that knowledge, the approach implemented to organize it, and the final form of the knowledge representations which resulted from our work are discussed in this paper.
Knowledge Acquisition for ATE Diagnosis
IEEE Aerospace and Electronic Systems Magazine ; 1 , 7 ; 5-12
01.07.1986
1517748 byte
Aufsatz (Zeitschrift)
Elektronische Ressource
Englisch
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