In order to locally analyze composite photonic crystal devices, an alternative measurement technique is required. These fundamental analysis problems are solved by investigating a photonic crystal device with a time-resolved and phase-sensitive near-field scanning optical microscope.


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    Title :

    Slow light in photonic crystal structures : a real space investigation


    Contributors:
    Kuipers, L. (author)


    Publication date :

    2005-01-01


    Size :

    203609 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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