In order to locally analyze composite photonic crystal devices, an alternative measurement technique is required. These fundamental analysis problems are solved by investigating a photonic crystal device with a time-resolved and phase-sensitive near-field scanning optical microscope.


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    Titel :

    Slow light in photonic crystal structures : a real space investigation


    Beteiligte:
    Kuipers, L. (Autor:in)


    Erscheinungsdatum :

    2005-01-01


    Format / Umfang :

    203609 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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