We have imaged the interiors of tapered and broad stripe semiconductor lasers under high current injection. Observation and analysis of the modal structure and internal catastrophic optical damage is presented.
Direct imaging of 0.81 /spl mu/m and 0.98 /spl mu/m tapered and broad stripe semiconductor laser diodes
1997-01-01
176432 byte
Conference paper
Electronic Resource
English
Direct Imaging of 0.81 m and 0.98m Tapered and Broad Stripe Semiconductor Laser Diodes
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