We have imaged the interiors of tapered and broad stripe semiconductor lasers under high current injection. Observation and analysis of the modal structure and internal catastrophic optical damage is presented.


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    Title :

    Direct imaging of 0.81 /spl mu/m and 0.98 /spl mu/m tapered and broad stripe semiconductor laser diodes


    Contributors:
    O'Brien, P. (author) / McInerney, J. (author)


    Publication date :

    1997-01-01


    Size :

    176432 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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