We have imaged the interiors of tapered and broad stripe semiconductor lasers under high current injection. Observation and analysis of the modal structure and internal catastrophic optical damage is presented.


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    Titel :

    Direct imaging of 0.81 /spl mu/m and 0.98 /spl mu/m tapered and broad stripe semiconductor laser diodes


    Beteiligte:
    O'Brien, P. (Autor:in) / McInerney, J. (Autor:in)


    Erscheinungsdatum :

    01.01.1997


    Format / Umfang :

    176432 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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