We have imaged the interiors of tapered and broad stripe semiconductor lasers under high current injection. Observation and analysis of the modal structure and internal catastrophic optical damage is presented.
Direct imaging of 0.81 /spl mu/m and 0.98 /spl mu/m tapered and broad stripe semiconductor laser diodes
01.01.1997
176432 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Direct Imaging of 0.81 m and 0.98m Tapered and Broad Stripe Semiconductor Laser Diodes
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