How to identify when a static pattern digital test program should be re-hosted as a dynamic pattern set on the state-of-the-art ATE is complicated. However, there are critical issues that should be evaluated when making this decision. Issues include chip models, timing parameters, drive strength, logic levels, circuit complexity, I/O pins, automated diagnostics, portability, reuse, speed, optimal circuit coverage, schematics, and data availability.


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    Title :

    Keeping current with technology: Identifying re-host candidates


    Contributors:

    Published in:

    Publication date :

    2011-10-01


    Size :

    4133149 byte




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English




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