How to identify when a static pattern digital test program should be re-hosted as a dynamic pattern set on the state-of-the-art ATE is complicated. However, there are critical issues that should be evaluated when making this decision. Issues include chip models, timing parameters, drive strength, logic levels, circuit complexity, I/O pins, automated diagnostics, portability, reuse, speed, optimal circuit coverage, schematics, and data availability.
Keeping current with technology: Identifying re-host candidates
IEEE Aerospace and Electronic Systems Magazine ; 26 , 10 ; 25-29
2011-10-01
4133149 byte
Article (Journal)
Electronic Resource
English
Keeping Current with Technology: Identifying Re-Host Candidates
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