How to identify when a static pattern digital test program should be re-hosted as a dynamic pattern set on the state-of-the-art ATE is complicated. However, there are critical issues that should be evaluated when making this decision. Issues include chip models, timing parameters, drive strength, logic levels, circuit complexity, I/O pins, automated diagnostics, portability, reuse, speed, optimal circuit coverage, schematics, and data availability.


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    Titel :

    Keeping current with technology: Identifying re-host candidates


    Beteiligte:

    Erschienen in:

    Erscheinungsdatum :

    01.10.2011


    Format / Umfang :

    4133149 byte




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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