The commonly used technique for carrier lifetime measurements in semiconductor lasers is corrected to take account of rapidly varying device impedance. Carrier lifetimes obtained with the new method provide vastly different values of carrier density and resolve inconsistencies in interpretation of recombination and spontaneous emission presented in the literature.


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    Title :

    Correction of carrier lifetime measurements of semiconductor lasers


    Contributors:


    Publication date :

    1995-01-01


    Size :

    172740 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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