We propose a modified prism-coupling method to measure the refractive index and thickness of single-mode thin waveguides. It is based on the effective index measurement in two orthogonal polarization directions. The measurement error, data fitting procedure, and technique limitations are discussed. This method can be applied to the evaluation of thin dielectric waveguides fabricated with isotropic, homogeneous organic and inorganic materials.
Optical characterization of thin dielectric waveguides
1999-01-01
159654 byte
Conference paper
Electronic Resource
English
Optical Characterization of Thin Dielectric Waveguides
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