We propose a modified prism-coupling method to measure the refractive index and thickness of single-mode thin waveguides. It is based on the effective index measurement in two orthogonal polarization directions. The measurement error, data fitting procedure, and technique limitations are discussed. This method can be applied to the evaluation of thin dielectric waveguides fabricated with isotropic, homogeneous organic and inorganic materials.


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    Titel :

    Optical characterization of thin dielectric waveguides


    Beteiligte:
    Xu Guang Huang (Autor:in) / Carosi, G. (Autor:in) / Persans, P. (Autor:in) / Xi-Cheng Zhang (Autor:in)


    Erscheinungsdatum :

    01.01.1999


    Format / Umfang :

    159654 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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